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Current issue

ELEKTRO 7/2020 was released on June 24th 2020. Its digital version will be available on July 24th 2020.

Topic: Cables, conductors and cable engineering

Main Article
New traction power supply technology 25 kV/50 Hz (part 2)

SVĚTLO (Light) 3/2020 was released on June 8th 2020. Its digital version will be available on July 8th 2020.

Professional organizations activities
Announcement: LUMEN V4 2020 is cancelled
What is new in CIE, April 2020

Accessories of lighting installations
Foxtrot as a “Master Control” in Hotel Breukelen
Lighting regulators – control of lighting on the constant level

Nanowires as sensors in new type of atomic force microscope

17. 10. 2016 | Phys.org | www.phys.org

A new type of atomic force microscope (AFM) uses nanowires as tiny sensors. Unlike standard AFM, the device with a nanowire sensor enables measurements of both the size and direction of forces.

Nanowires are extremely tiny filamentary crystals which are built-up molecule by molecule from various materials and which are now being very actively studied by scientists all around the world because of their exceptional properties. The wires normally have a diameter of 100 nanometers and therefore possess only about one thousandth of a hair thickness.

New type of atomic force microscope

The team from the Swiss Nanoscience Institute (SNI) and the Department of Physics at the University of Basel has now demonstrated that nanowires can also be used as force sensors in atomic force microscopes. Based on their special mechanical properties, nanowires vibrate along two perpendicular axes at nearly the same frequency. When they are integrated into an AFM, the researchers can measure changes in the perpendicular vibrations caused by different forces. Essentially, they use the nanowires like tiny mechanical compasses that point out both the direction and size of the surrounding forces.

Read more at Phys.org

Image Credit: University of Basel, Department of Physics

-jk-